专利名称：Built-in self-test (BIST) architecture having
distributed interpretation and generalizedcommand protocol
发明人：Roberto Fabian Averbuj,David W. Hansquine申请号：US10630480申请日：20030729公开号：US07392442B2公开日：20080624
专利附图：
摘要：A built-in self-test (BIST) architecture having distributed algorithminterpretation is described. The architecture includes three tiers of abstraction: a
centralized BIST controller, a set of sequencers, and a set of memory interfaces. The BISTcontroller stores a set of commands that generically define an algorithm for testingmemory modules without regard to the physical characteristics or timing requirementsof the memory modules. The sequencers interpret the commands in accordance with acommand protocol and generate sequences of memory operations. The memoryinterfaces apply the memory operations to the memory module in accordance withphysical characteristics of the memory module, e.g., by translating address and datasignals based on the row-column arrangement of the memory modules to achieve bitpatterns described by the commands. The command protocol allows powerfulalgorithms to be described in an extremely concise manner that may be applied tomemory modules having diverse characteristics.
申请人：Roberto Fabian Averbuj,David W. Hansquine
地址：San Diego CA US,San Diego CA US
国籍：US,US
代理人：Nicholas J. Pauley,John L. Ciccozzi,Thomas Rouse
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