专利名称：A DUAL-BAND MULTI-LEVEL MICROBRIDGE
DETECTOR
发明人：MARSHALL, Charles, M.,BLACKWELL, Richard申请号：EP96940561.0申请日：19961115公开号：EP0861504A1公开日：19980902
摘要：A dual-band detector that absorbs incident radiation in a first range ofwavelengths and that absorbs incident radiation in a second range of wavelengths. Thedual-band detector includes a semiconductor substrate and a first microbridge detectorlevel disposed above the semiconductor substrate. The first microbridge detector levelincludes an active area that absorbs incident radiation in one of the first range ofwavelengths and the second range of wavelengths. In one embodiment, the
semiconductor substrate includes a detector that detects incident radiation in the otherof the first and second range of wavelengths. In another embodiment, the dual-bandmicrobridge detector also includes a second microbridge detector level. The secondmicrobridge detector level also includes an active area that absorbs incident radiation inan alternative one of the first range of wavelengths and the second range or
wavelengths. With this apparatus, the dual-band detector can operate in a first range ofwavelengths and also in a second range of wavelengths. In addition, this apparatus can befabricated using existing processing techniques.
申请人：Lockheed-Martin IR Imaging Systems
地址：Two Forbes Road Lexington, MA 02173 US
国籍：US
代理机构：de Beaumont, Michel
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