专利名称：METHOD AND APPARATUS FOR MEMORY
REPAIR
发明人：Shuo-Nan Hung,Chi Lo,Chun-Hsiung Hung申请号：US14036997申请日：20130925
公开号：US20140254297A1公开日：20140911
专利附图：
摘要：An integrated circuit includes an array of memory cells that is arranged intorows, main columns, and redundant columns that perform repairs in the array. The maincolumns and the redundant columns are divided into row blocks. Bit lines couple the main
columns to status memory indicating repair statuses of the repairs by the redundantcolumns. The integrated circuit receives a command, and performs an update on thestatus memory with the repair statuses specific to particular ones of the row blocks in aportion of the memory accessed by the command. Alternatively or in combination, thestatus memory has insufficient size to store the repair statuses of multiple ones of therow blocks of the main columns.
申请人：Macronix International Co., Ltd.
地址：Hsinchu TW
国籍：TW
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