专利名称：Device for testing electrical characteristics
of chips
发明人：Jen-Kuang Fang申请号：US10287336申请日：20021104
公开号：US20030094963A1公开日：20030522
专利附图：
摘要：The present invention discloses a device for testing electrical characteristics of achip, which is capable of verifying whether each chip can meet the requirement of theelectrical specifications, and sort out the chips under the specifications. The invention
utilizes a probe to contact the extension area of the under bump metallurgy to detect ifthe electrical characteristics of the chip can meet the requirement of the specifications.As the bumps on the chip do not actually contact the probe, the intact profile for thebumps on the chips can be assuredly kept so that the problem of voids existing in themelted bumps during reflow process can be avoided.
申请人：FANG JEN-KUANG
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