Method of and apparatus for measuring elongation o

专利名称：Method of and apparatus for measuring

elongation of a test specimen

发明人：Toshio Hiyoshi申请号：US09838120申请日：20010420公开号：US06460418B1公开日：20021008

专利附图：

摘要：Method and apparatus for measuring elongation in a contactless mannercapable of obtaining accurate measured value without attaching reference lines andcapable of being automated, laser beams are irradiated from two sensor sections each

has a laser projector and a CCD camera to prescribed reference line positions at twopositions on a test specimen, laser reflection lights are photographed respectively asspeckle patterns with a plurality of fringes respectively by the CCD cameras, the fringesat predetermined positions the speckle patterns are recognized on the coordinate of theCCD camera screens as targets correspondingly to the prescribed reference linepositions at two positions respectively, and the moving amount on the pixel unit basis onthe coordinate of the target fringes that move in accordance with the elongation of thetest specimen are detected respectively to determine the elongation information of thetest specimen, the fringes of the speckle patterns photographed by the CCD camerasmay be image converted into the marks at the predetermined positions of the televisioncamera screens. Stopping or disturbance of image of the speckle patterns of the CCDcamera appearing just before the fracture of the test specimen may be sensed to stopthe application of the tensile load on the test specimen.

申请人：KISHIMOTO SANGYO CO., LTD.

代理机构：Armstrong, Westerman & Hattori, LLP

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