专利名称：Vitreous silica crucible发明人：Toshiaki Sudo,Hiroshi Kishi申请号：US13148463申请日：20101213公开号：US09416463B2公开日：20160816
专利附图：
摘要：Provided is a vitreous silica crucible having a reference point, which is capable ofaccurately detecting the location of a defect in the vitreous silica crucible used for pullingsilicon single crystal, determining a defect generating site of silicon single crystal, andinvestigating the cause of the defect. The reference point used for specifying the position
relationship with respect to a particular part is formed in at least one site of an endportion, an inner wall and an outer wall of the crucible.
申请人：Toshiaki Sudo,Hiroshi Kishi
地址：Akita JP,Akita JP
国籍：JP,JP
代理机构：Law Office of Katsuhiro Arai
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