Test Object - Device SettingsSubstation/Bay:Substation:Bay:35kV Switch GearINCOMER 2Substation address:Bay address:Central Heating Plant5741-SWG-101Device:Name/description:Device type:Serial/model number:Additional info 1:Additional info 2:REF543Overcurrent343301CT 400/1/1/1aManufacturer:Device address:ABB1Hardware ConfigurationTest EquipmentTypeCMC256-6Serial NumberEI743LHardware CheckPerformed At04.09.2011 09:23:57ResultPassedDetailsOvercurrent L1-L2:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 10:05:29Version:Test End:Manager:2.40 SR 104-Sep-2011 10:26:46Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s740,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoManualPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL1-L2L1-L2L1-L2L1-L2L1-L2L1-L2L1-L2L1-L2Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stmin739,87 s198,45 s88,04 s41,70 s22,29 s8,52 s2,86 s0,69 stmaxNo trip635,90 s159,93 s64,10 s32,18 s11,79 s3,90 s0,94 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameAndTrigger StateTrip 1Start XShot Test Results:TypeL1-L2L1-L2L1-L2L1-L2L1-L2L1-L2L1-L2L1-L2Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stactNo trip317,75 s116,42 s51,42 s26,73 s10,02 s3,34 s0,81 sOverloadNoNoNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedPassedPassedState:8 out of 8 points tested.8 points passed.0 points failed.General Assessment: Test passed! Overcurrent L2-L3:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 10:27:56Version:Test End:Manager:2.40 SR 104-Sep-2011 10:49:13Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s740,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoManualPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL2-L3L2-L3L2-L3L2-L3L2-L3L2-L3L2-L3L2-L3Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stmin739,87 s198,45 s88,04 s41,70 s22,29 s8,52 s2,86 s0,69 stmaxNo trip635,90 s159,93 s64,10 s32,18 s11,79 s3,90 s0,94 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameAndTrigger StateTrip 1Start XShot Test Results:TypeL2-L3L2-L3L2-L3L2-L3L2-L3L2-L3L2-L3L2-L3Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stactNo trip317,89 s116,46 s51,43 s26,74 s10,02 s3,34 s0,82 sOverloadNoNoNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedPassedPassedState:8 out of 8 points tested.8 points passed.0 points failed.General Assessment: Test passed! Overcurrent L3-L1:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 10:49:30Version:Test End:Manager:2.40 SR 104-Sep-2011 11:10:46Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s740,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoManualPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL3-L1L3-L1L3-L1L3-L1L3-L1L3-L1L3-L1L3-L1Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stmin739,87 s198,45 s88,04 s41,70 s22,29 s8,52 s2,86 s0,69 stmaxNo trip635,90 s159,93 s64,10 s32,18 s11,79 s3,90 s0,94 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameAndTrigger StateTrip 1Start XShot Test Results:TypeL3-L1L3-L1L3-L1L3-L1L3-L1L3-L1L3-L1L3-L1Relative ToI #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase I #1 Phase Factor1,000 1,120 1,300 1,600 2,000 3,000 5,000 10,000 Magnitude1,00 A1,12 A1,30 A1,60 A2,00 A3,00 A5,00 A10,00 AAnglen/an/an/an/an/an/an/an/atnomNo trip314,47 s115,94 s51,28 s26,67 s10,00 s3,33 s0,81 stactNo trip317,50 s116,36 s51,40 s26,70 s10,02 s3,35 s0,82 sOverloadNoNoNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedPassedPassedState:8 out of 8 points tested.8 points passed.0 points failed.General Assessment: Test passed! Overcurrent L1-E:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 09:34:38Version:Test End:Manager:2.40 SR 104-Sep-2011 09:34:49Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s3,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoAutomaticPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL1-EL1-EL1-EL1-EL1-EL1-EL1-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 A15,60 AAnglen/an/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 s0,25 stmin0,52 s0,21 s0,21 s0,21 s0,21 s0,21 s0,21 stmax0,73 s0,66 s0,60 s0,29 s0,29 s0,29 s0,29 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameOrTrigger StateTrip 1Start XShot Test Results:TypeL1-EL1-EL1-EL1-EL1-EL1-EL1-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 A15,60 AAnglen/an/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 s0,25 stact0,63 s0,26 s0,26 s0,26 s0,26 s0,25 s0,25 sOverloadNoNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedPassedState:7 out of 7 points tested.7 points passed.0 points failed.General Assessment: Test passed! Overcurrent L2-E:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 11:12:35Version:Test End:Manager:2.40 SR 104-Sep-2011 11:12:45Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s3,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoAutomaticPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL2-EL2-EL2-EL2-EL2-EL2-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 AAnglen/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 stmin0,52 s0,21 s0,21 s0,21 s0,21 s0,21 stmax0,73 s0,66 s0,60 s0,29 s0,29 s0,29 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameOrTrigger StateTrip 1Start XShot Test Results:TypeL2-EL2-EL2-EL2-EL2-EL2-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 AAnglen/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 stact0,63 s0,57 s0,25 s0,26 s0,26 s0,26 sOverloadNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedState:6 out of 6 points tested.6 points passed.0 points failed.General Assessment: Test passed! Overcurrent L3-E:Test Object - Overcurrent ParametersGeneral - Values:TimeTolAbs:TimeTolRel:CurrentTolAbs:CurrentTolRel:Directional:0,04 s5,00 %0,05 Iref5,00 %NoVT connection:CT starpoint connection:At protected objectTo protected objectElements - Phase:ActiveYesNoNoNameI #1 Phase I #2 Phase I #3 Phase Tripping characteristicIEC / BS142 EI IEC Extremely Inverse IEC Extremely Inverse I Pick-up1,00 Iref1,00 Iref1,00 IrefTime1,00 0,65 0,65 Reset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Elements - Residual:ActiveYesNoNoNameI #1 Residual I #2 Residual I #3 Residual Tripping characteristicIEC Definite Time IEC Definite Time IEC Definite Time I Pick-up12,00 Iref12,00 Iref12,00 IrefTime0,25 s0,25 s0,25 sReset Ratio0,95 0,95 0,95 DirectionNon Directional Non Directional Non Directional Test ModuleName:Test Start:User Name:Company:OMICRON Overcurrent04-Sep-2011 11:14:12Version:Test End:Manager:2.40 SR 104-Sep-2011 11:14:22Test Settings:Fault Model:Time reference:Load current:Load angle:Prefault time:Abs. max time:Post fault time:Rel. max time:Enable voltage output:Fault voltage LN (for all but two phase faults):Fault voltage LL (for two phase faults):Decaying DC active:Time constant:CB char min time:Thermal reset active:Thermal reset method:Thermal reset message:Fault inception0,00 A0,00 °0,10 s3,00 s0,50 s100,00 %No30,00 V51,96 VNo0,05 s0,05 sNoAutomaticPlease reset the Thermal Memory of the device under test before continuing. Shot Test:TypeL3-EL3-EL3-EL3-EL3-EL3-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 AAnglen/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 stmin0,52 s0,21 s0,21 s0,21 s0,21 s0,21 stmax0,73 s0,66 s0,60 s0,29 s0,29 s0,29 sBinary Outputs:NameBin. Out 1 Bin. Out 2 Bin. Out 3 Bin. Out 4 StateNoNoNoNoBinary Inputs:Trigger Logic:NameOrTrigger StateTrip 1Start XShot Test Results:TypeL3-EL3-EL3-EL3-EL3-EL3-ERelative ToI #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual I #1 Residual Factor0,950 1,000 1,050 1,100 1,200 1,300 Magnitude11,40 A12,00 A12,60 A13,20 A14,40 A15,60 AAnglen/an/an/an/an/an/atnom0,62 s0,25 s0,25 s0,25 s0,25 s0,25 stact0,63 s0,57 s0,26 s0,26 s0,26 s0,26 sOverloadNoNoNoNoNoNoResultPassedPassedPassedPassedPassedPassedState:6 out of 6 points tested.6 points passed.0 points failed.General Assessment: Test passed! Triptest of the CB is successfull done.Sinature: