专利名称：Testing system, a computer implemented
testing method and a method formanufacturing electronic devices
发明人：Masahumi Asano申请号：US10947259申请日：20040923公开号：US07047147B2公开日：20060516
专利附图：
摘要：A testing system includes a testing device configured to test productcharacteristics of a first sample by sampling the first sample from a population; a main
storage device configured to store analysis information and testing information, thetesting information includes a confidence interval tolerance of the first sample; ananalysis module configured to analyze at least one of statistical data and a confidenceinterval of a mean value of the population, based on the analysis information; and acalculation module configured to calculate a first sampling number of the first sample,based on results of the analysis module.
申请人：Masahumi Asano
地址：Yokohama JP
国籍：JP
代理机构：Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
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