专利名称：Method and system for testing
semiconductor devices
发明人：Ernest Walker,Ronald A. Sartschev申请号：US11018540申请日：20041221
公开号：US20060132165A1公开日：20060622
专利附图：
摘要：A semiconductor device tester includes a parametric measurement unit (PMU)stage for producing a DC test signal and a pin electronics (PE) stage for producing an ACtest signal to test a semiconductor device. A driver circuit is capable of providing a version
of the DC test signal and a version of the AC test signal to the semiconductor device.
申请人：Ernest Walker,Ronald A. Sartschev
地址：Weston MA US,Dunstable MA US
国籍：US,US
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