专利名称：Methods of calibration transfer for a testing
instrument
发明人：Jing Shen,Christopher Jones,Dingding
Chen,Michael T. Pelletier,RobertAtkinson,David Perkins
申请号：US14364119申请日：20111216公开号：US10082600B2公开日：20180925
专利附图：
摘要：A method of calibration transfer for a testing instrument includes: collecting a
first sample; generating a standard response of a first instrument based, at least in part,on the first sample; and performing instrument standardization of a second instrumentbased, at least in part, on the standard response of the first instrument. Data
corresponding to a second sample is then obtained using the second instrument and acomponent of the second sample is identified based, at least in part, on a calibrationmodel.
申请人：Jing Shen,Christopher Jones,Dingding Chen,Michael T. Pelletier,RobertAtkinson,David Perkins
地址：Houston TX US,Houston TX US,Plano TX US,Houston TX US,Richmond TXUS,Irmo SC US
国籍：US,US,US,US,US,US
代理机构：Baker Botts L.L.P.
代理人：Benjamin Fite
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