Measuring apparatus and measuring method

专利名称：Measuring apparatus and measuring

method

发明人：鎌田 康良申请号：JP2015228323申请日：20151124公开号：JP6570981B2公开日：20190904

摘要：PROBLEM TO BE SOLVED: To measure a capacitance value, etc., while a definedvoltage is accurately applied to a capacitor component, etc., to be measured.SOLUTION:A measurement device of the present invention comprises: a voltage generation unit 2 forgenerating an AC voltage Vm for measurement that is applied to an electroniccomponent 11; a voltage detection unit 3 for detecting an end-to-end voltage V1developed between both ends of the electronic component 11 due to that a

measurement current Im flows when the AC voltage Vm for measurement is applied; acurrent detection unit 4 for detecting the measurement current Im; and a processing unit5 for executing a measurement process to measure the capacitance Value C of a

capacitor as the electronic component 11 on the basis of the frequencies f of the end-to-end voltage V1, measurement current Im, and AC voltage Vm for measurement. Theprocessing unit 5 executes a phase difference detection process to detect a phasedifference θ between the end-to-end voltage V1 and the measurement current Im, andon the occasion of the measurement process, causes the voltage generation unit 2 togenerate the AC voltage Vm for measurement with a corrected defined voltage value Vrcthat is a defined voltage value Vr, used when measuring the capacitance value C, that is

multiplied by 1/sinθ.SELECTED DRAWING: Figure 1

申请人：日置電機株式会社

地址：長野県上田市小泉８１番地

国籍：JP

代理人：酒井 伸司

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