专利名称：Measuring device, microscope, and
measuring method
发明人：太田 泰輔申请号：JP2017563360申请日：20170804公开号：JP6485847B2公开日：20190320
摘要：A kind of measuring device, microscope are provided, and measuring thosemakes precise measurement be possible. The present invention of measuring deviceaccording to the embodiment is equipped with gold nanoparticle (11), it is set to interioror wave beam nearby focusing light and scattering light, to generate scattering light,angle of that scattering of the intensity of the scattering light of detector (21) detectionis greater than maximum convergent angle, and these form focuses and are thoseforward scattering light with forward scattering from the change particle of the positionof gold nanoparticle (11) and driving unit relative to focusing.
申请人：サイエンスエッジ株式会社
地址：静岡県浜松市浜北区横須賀１３３５－１
国籍：JP
代理人：家入 健
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