EDDY-CURRENT TESTING METHOD AND EDDY-CURRENT TESTI

专利名称：EDDY-CURRENT TESTING METHOD AND

EDDY-CURRENT TESTING DEVICE

发明人：HIBINO Takashi,FUJIMOTO

Takashi,KOMATSU Keisuke,NAKAOYoshiyuki,TAKATA Makoto,SAKAMOTOMakoto

申请号：EP09834729.7申请日：20091214公开号：EP2369333A1公开日：20110928

专利附图：

摘要：In an eddy current testing method which involves using a rotatable eddy currenttesting probe in which a detection coil is arranged within an exciting coil, a change indetection sensitivity (a deviation of detection sensitivity) which changes depending on therotational position of the detection coil is reduced. The eddy current testing probeincludes an exciting coil EC1, a detection coil DC1, an exciting coil EC2 and a detection coilDC2, which are mounted on a disk DS. The eddy current testing probe is placed so as toface a circumferential surface of an object to be inspected T, which is in the shape of acircular cylinder, and the disk DS is rotated. Then, the distance (liftoff) between thedetection coils DC1 and DC2 and an inspection surface changes. Therefore, also thedetection sensitivity to a flaw signal changes. To reduce the change in detectionsensitivity, the detection sensitivity is adjusted by detecting the rotational position(rotational angle) of the detection coils DC1 and DC2.

申请人：Sumitomo Metal Industries, Ltd.

地址：5-33, Kitahama 4-chome Chuo-ku Osaka-shi Osaka 541-0041 JP

国籍：JP

代理机构：Zimmermann & Partner

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