专利名称：Scanning probe microscope发明人：Kitamura, Shinichi,Sueyoshi, Takashi申请号：EP98305412.3申请日：19980708公开号：EP0890820B1公开日：20040324
摘要：There is disclosed a scanning probe microscope capable of producing a
topographic image at a high resolution with a cantilever of a large spring constant and, atthe same time, a surface potential image at a high resolution. This microscope can takethe form of an atomic force microscope that detects the surface potential of a sample,using a force gradient acting between the probe tip and a sample. The gradient isrepresented by the output from a frequency-to-voltage converter.
申请人：JEOL LTD
地址：JP
国籍：JP
代理机构：Cross, Rupert Edward Blount
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